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SHIMIZU Maki

Faculty: Graduate School of Science and Engineering TEL:
Position: Assistant Professor ■FAX:
Address: Shimo-Okubo 255, Sakura-ku, Saitama-shi, 338-8570 JAPAN ■Mail Address:
■Web site:

Profile

Assigned Class

Faculty of Engineering

Academic Background

Degree
PhD (Science) , Tokyo Univrersity of Science

Research

Books, Articles, etc.

Books
Diamond for Quantum Applications Part 1 Chapter 5 “Charge state control by band engineering
Semiconductors and Semimetals,:137-159 202006
ISBN:780128202418
T. Makino, H. Kato, M. Shimizu, Mutsuko Hatano, Norikazu Mizuochi

Articles
The influence of oxygen related defects on the formation of In2O3-based low fluorescence transparent conducting film
,pss(a) 2023
Maki Shimizu, Masataka Shugo, Shun Mori, Yasuto Hijikata, Shinya Aikawa

Charge states of nitrogen-vacancy centers in Fermi level controlled diamond n-i-n junctions
,Journal of Applied Physics,133:214401 2023
M. Shimizu, T. Makino, H. Kato, M. Fujiwara, M. Ogura,N. Mizuochi,M. Hatano,

垂直配向カーボンナノチューブを用いた最大静止摩擦力の測定
,表面と真空, 62:39 2019
福田美実, 井上枝実, 四本松康太, 清水麻希, 本間芳和.

Engineering of Fermi level by nin diamond junction for control of charge states of NV centers
,Appl. Phys. Lett.,112:111903 2018
T. Murai, T. Makino, H. Kato, M. Shimizu, T. Murooka, E. D. Herbschleb, Y. Doi H. Morishita, M.Fujiwara, M.Hatano, S.Yamasaki, N.mizuochi

カーボンナノチューブのオゾンによる損傷の評価
,表面と真空,61:797 2018
石川諒, 中野尭雄, 島龍之介, 清水麻希, 本間芳和

Terahertz Spectroscopy of Individual Carbon Nanotube Quantum Dots.
,Nano letters,19(1):242 2018
T. Tsurugaya, K. Yoshida, F. Yajima, M. Shimizu, Y. Homma, and K. Hirakawa,

Charge-state control of ensemble of nitrogen vacancy centers by n–i–n diamond junctions,
,Appl. Phys. Express,11:033004 2018
M. Shimizu, T. Makino, T. Iwasaki, K. Tahara, H. Kato, N. Mizuochi, S. Yamasaki and M. Hatano

Effect of interfacial water formed between graphene and SiO2/Si substrate
,Appl. Phys. Express,10:075012 2017
T. Koyama, T. Inaba, K. Komatsu, S. Moriyama, M. Shimizu, and Y. Homma

Raman imaging of millimeter-long carbon nanotubes grown by a gas flow method
,Appl. Phys. Express, ,10:025103 2017
K. Kihara, A. Ishitani, T. Koyama, M. Fukasawa, T. Inaba, M. Shimizu, and Y. Homma

Correlation between active layer thickness and ambient gas stability in IGZO thin-film transis-tors
,Journal of Physics D: Applied Physics,50:025012 2016
X. Gao, M-F Lin, B-H Mao, M. Shimizu, N. Mitoma, T. Kizu, W. Ou-Yang, T Nabatame, Z. Liu, Kazuhito Tsukagoshi

Charge state modulation of nitrogen vacancy centers in diamond by applying a forward voltage across a p–i–n junction
,Diamond and Related Materials,63:192 2016
M. Shimizu, T. Makino, T. Iwasaki, J. Hasegawa, K. Tahara, W. Naruki, H. Kato, S. Yamasaki, M. Hatano

Influence of Al2O3 layer insertion on the electrical properties of Ga-In-Zn-O thin-film tran-sistors.
,J. Vac. Sci. Technol., A,33:061506 2015
K. Kurishima, T. Nabatame, M. Shimizu, N. Mitoma, T. Kizu, S. Aikawa, K. Tsukagoshi, A. Ohi,T. Chikyow, A. Ogura

Fabrication of diamond lateral p–n junction diodes on (111) substrates
, Physica Status Solidi A,,212:2548 2015
K. Sato, T. Iwasaki, M. Shimizu, H. Kato, T. Makino, M. Ogura, D. Takeuchi S. Yamasaki and M. Hatano

Improvement of fluorescence intensity of nitrogen vacancy centers in self-formed diamond mi-crostructures
,Appl. Phys. Lett.,107:163102 2015
S. Furuyama, K. Tahara, T. Iwasaki, M. Shimizu, J. Yaita, M. Kondo, T. Kodera, and M. Hatano

Influence of Al2O3 gate dielectric on transistor properties for IGZO thin film transistor
,ECS Trans.,61:345 2014
K. Kurishima, T. Nabatame, M. Shimizu, S. Aikawa, K. Tsukagoshi, A. Ohi, T. Chikyo, A. Ogura